{"schema_version":"secwatch.filing_event.v1","accession":"0001193125-25-047878","form_type":"8-K","ticker":"TER","cik":"0000097210","company_name":"TERADYNE, INC","filed_at":"2025-03-06T23:59:59+00:00","discovered_at":"2026-05-14T18:03:06.927604+00:00","generated_at":"2026-05-25T08:49:49.017741+00:00","sec_items":["5.02","9.01"],"event_type":"leadership","sentiment":"neutral","materiality_score":0.6,"calibrated_materiality_score":0.6,"confidence":"high","headline":"Teradyne President of Semiconductor Test Richard J. Burns to Retire Effective June 1, 2025","bullets":["Richard J. Burns notified Teradyne of his retirement as President, Semiconductor Test on March 5, 2025.","His retirement is effective June 1, 2025.","The company filed an 8-K reporting the departure under Item 5.02.","Teradyne trades on Nasdaq under ticker TER."],"urls":{"canonical":"https://secwatch.observer/filing/0001193125-25-047878","json":"https://secwatch.observer/filing/0001193125-25-047878.json","markdown":"https://secwatch.observer/filing/0001193125-25-047878.md","text":"https://secwatch.observer/filing/0001193125-25-047878.txt","edgar_index":"https://www.sec.gov/Archives/edgar/data/97210/000119312525047878/0001193125-25-047878-index.htm","edgar_primary_document":"https://www.sec.gov/Archives/edgar/data/97210/000119312525047878/d129062d8k.htm"},"model":{"generated_by":"deepseek-v4-flash:cloud","generated_at":"2026-05-25T08:49:49.017741+00:00"},"review":{"review_status":"machine_generated","human_reviewed":false,"corrected":false,"correction_note":null,"correction_timestamp":null,"superseded_by":null,"related_filings":[]},"source_grounded_claims":[{"claim_id":"e26aaba2db","claim":"Richard J. Burns retired as President, Semiconductor Test at TERADYNE, INC.","evidence_excerpt":"On March 5, 2025, Richard J. Burns notified Teradyne, Inc. (the “Company”) of his decision to retire as President, Semiconductor Test of the Company effective June 1, 2025.","evidence_source":"SEC 8-K Item 5.02","evidence_url":"https://www.sec.gov/Archives/edgar/data/97210/000119312525047878/0001193125-25-047878-index.htm","confidence":0.95,"family_label":"Executive change","details":[{"label":"Action","value":"retired"},{"label":"Role","value":"President, Semiconductor Test"}],"fact_type":"executive_change"}],"license":"Source filings: public domain (SEC EDGAR). Summaries (headline + bullets): CC-BY-4.0; attribute https://secwatch.observer"}