{"schema_version":"secwatch.filing_event.v1","accession":"0001437749-25-005580","form_type":"8-K","ticker":"ASTC","cik":"0001001907","company_name":"ASTROTECH Corp","filed_at":"2025-02-28T23:59:59+00:00","discovered_at":"2026-05-14T18:03:02.637558+00:00","generated_at":"2026-05-25T22:30:25.304865+00:00","sec_items":["8.01","9.01"],"event_type":"other_material","sentiment":"positive","materiality_score":0.5,"calibrated_materiality_score":0.5,"confidence":"high","headline":"Astrotech launches EN-SCAN subsidiary for field GC-MS instruments; debut at PITTCON","bullets":["Astrotech creates wholly owned subsidiary EN-SCAN, Inc. to manufacture and sell environmental testing instruments using proprietary GC-MS technology.","Product lineup includes Rugged-Lab GC-MS, Fenceline Monitor (BTEX detection), and Handheld GC for field analysis.","EN-SCAN product line will debut at PITTCON 2025 in Boston (March 1-5, 2025, booth 422).","Instruments target real-time on-site air, water, soil contamination monitoring for compliance and emergency response."],"urls":{"canonical":"https://secwatch.observer/filing/0001437749-25-005580","json":"https://secwatch.observer/filing/0001437749-25-005580.json","markdown":"https://secwatch.observer/filing/0001437749-25-005580.md","text":"https://secwatch.observer/filing/0001437749-25-005580.txt","edgar_index":"https://www.sec.gov/Archives/edgar/data/1001907/000143774925005580/0001437749-25-005580-index.htm","edgar_primary_document":"https://www.sec.gov/Archives/edgar/data/1001907/000143774925005580/astc20250227_8k.htm"},"model":{"generated_by":"deepseek-v4-flash:cloud@v2","generated_at":"2026-05-25T22:30:25.304865+00:00"},"review":{"review_status":"machine_generated","human_reviewed":false,"corrected":false,"correction_note":null,"correction_timestamp":null,"superseded_by":null,"related_filings":[]},"source_grounded_claims":[],"license":"Source filings: public domain (SEC EDGAR). Summaries (headline + bullets): CC-BY-4.0; attribute https://secwatch.observer"}